The surfaces of [001] SrTiO3 substrates were modified by implantation of 400 keV Ne2+ ions at 77 K at doses of 5 x 10(14), 10(15) and 5 x 10(15) ions/cm2. Superconducting YBa2Cu3O7-x thin films were then deposited on these substrates by the electron beam co-evaporation and post-annealing process. The microstructure and properties of these films were characterized by various techniques and compared to a reference film that was grown on an unirradiated SrTiO3 substrate. The film on the substrate irradiated at the highest dose (5 x 10(16) ions/cm2) showed a deterioration of its properties as reflected by a loss in epitaxy, decrease in transition temperature and increase in transition width. However, films grown on the substrates irradiated at the lower doses showed improvements in the properties as compared to the reference film. The best film was obtained on the substrate irradiated at 10(15) ions/cm2. This film exhibited a significant improvement in epitaxy and an increase in the transition temperature as compared to the reference film.

Tl-based superconducting thick films deposited on large-area (11.4 cm2) Ag alloy (Consil 995) substrates have been characterized by surface resistance measurements yielding values of 4 and 14 m-OMEGA at 4 and 77 K, respectively, as measured in an 18 GHz Cu cavity; corresponding Cu values are 8 and 21 m-OMEGA. Utilizing a Nb cavity, the dependence of surface resistance on microwave power was also measured. The surface resistance begins to rise in microwave magnetic fields of 1-10 Oe and saturates in 20-60 Oe, the exact values depending on the degree of c-axis texturing of the polycrystalline films. Enhanced texturing sharpens the high-frequency transition into the superconducting state and also weakens the dependence of surface resistance on microwave magnetic field. These results are significant for high temperature superconductor applications such as microwave cavities.

A comprehensive overview is presented of the elements that enter quantitative techniques of texture measurement, analysis and representations. There are many potential errors to be corrected and many choices to be made in all these stages, and we present those that we consider most appropriate. They have been implemented in a software package that is available publicly. A number of novel techniques are used including, for example, in the representation of measured textures, both for quantitative visual inspection and for use in the prediction of anisotropic properties. The symmetry of the test sample is allowed to be general, and that of the crystal structure may be as low as trigonal.